

FECBIS-1
Low Noise, 다중 VIH Level, High Frequency (SERDES Chip, TCON), High Peak Current에 특화된 Burn-in Solution
Zone organization | Zone per Slot |
---|---|
Pattern Zone | Max 24(user setting) |
Pattern Slot | 8slot per Temp zone |
Temperature Zone | 3 (-40’C to 150’C) |
Slot synchronization | Parallel, Serial |
driver-receivers | Up to 256 (512 option) |
Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
System rep rate | MAX 10 MHz |
Sequence controller | Micro programmable in vector memory |

F-1
FECBIS-1에서 업그레이드 된 고사양의 Burn-in Solution
Zone organization | Zone per Slot |
---|---|
Pattern Zone | Max 32(user setting) |
Pattern Slot | 16 slot per Temp zone |
Temperature Zone | 2 (Ambient to 150’C) |
Slot synchronization | Parallel, Serial |
driver-receivers | Up to 256 (512 option) |
Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
System rep rate | MAX 10 MHz |
Sequence controller | Micro programmable in vector memory |

FECBIS-CP
High Voltage와 High Peak Current에 특화된 Power IC Burn-in Solution
Zone organization | 3 Slot per Zone |
---|---|
Pattern Zone | Max 2 |
Pattern Slot | 6 |
Temperature Zone | 1 |
driver-receivers | Up to 64 |
Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
Sequence controller | Micro programmable in vector memory |