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Semiconductor

New Technology Tester Leader

FECBIS-1
FECBIS-1

Low Noise, 다중 VIH Level, High Frequency (SERDES Chip, TCON), High Peak Current에 특화된 Burn-in Solution

Zone organization Zone per Slot
Pattern Zone Max 24(user setting)
Pattern Slot 8slot per Temp zone
Temperature Zone 3 (-40’C to 150’C)
Slot synchronization Parallel, Serial
driver-receivers Up to 256 (512 option)
Programmable clocks Leading and trailingedges per pin;
8 on-the-fly timing sets
System rep rate MAX 10 MHz
Sequence controller Micro programmable in vector memory
F-1
F-1

FECBIS-1에서 업그레이드 된 고사양의 Burn-in Solution

Zone organization Zone per Slot
Pattern Zone Max 32(user setting)
Pattern Slot 16 slot per Temp zone
Temperature Zone 2 (Ambient to 150’C)
Slot synchronization Parallel, Serial
driver-receivers Up to 256 (512 option)
Programmable clocks Leading and trailingedges per pin;
8 on-the-fly timing sets
System rep rate MAX 10 MHz
Sequence controller Micro programmable in vector memory
FECBIS-CP
FECBIS-CP

High Voltage와 High Peak Current에 특화된 Power IC Burn-in Solution

Zone organization 3 Slot per Zone
Pattern Zone Max 2
Pattern Slot 6
Temperature Zone 1
driver-receivers Up to 64
Programmable clocks Leading and trailingedges per pin;
8 on-the-fly timing sets
Sequence controller Micro programmable in vector memory
1