FECBIS-CP
This Power IC Burn-in Tester is specialized in high voltage and high peak current.
| Zone organization | 3 Slot per Zone |
|---|---|
| Pattern Zone | Max 2 |
| Pattern Slot | 6 |
| Temperature Zone | 1 |
| driver-receivers | Up to 64 |
| Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
| Sequence controller | Micro programmable in vector memory |
F-1
This Burn-in Tester has high end features upgarded from FECBIS-1.
| Zone organization | Zone per Slot |
|---|---|
| Pattern Zone | Max 32(user setting) |
| Pattern Slot | 16 slot per Temp zone |
| Temperature Zone | 2 (Ambient to 150’C) |
| Slot synchronization | Parallel, Serial |
| driver-receivers | Up to 256 (512 option) |
| Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
| System rep rate | MAX 10 MHz |
| Sequence controller | Micro programmable in vector memory |
FECBIS-1
This Burn-in tester has test channels with low noise, multi VIH level, high frequency ( SERDES Chip, TCON) and high peak current.
| Zone organization | Zone per Slot |
|---|---|
| Pattern Zone | Max 24(user setting) |
| Pattern Slot | 8slot per Temp zone |
| Temperature Zone | 3 (-40’C to 150’C) |
| Slot synchronization | Parallel, Serial |
| driver-receivers | Up to 256 (512 option) |
| Programmable clocks | Leading and trailingedges per pin;
8 on-the-fly timing sets |
| System rep rate | MAX 10 MHz |
| Sequence controller | Micro programmable in vector memory |
