UNI940A
| Test Device | DRAM |
|---|---|
| Parallelism | 6,144 |
| Temperature Range | -10℃ ~ 125℃ |
| Test Frequency | 400Mbps |
| Dimension (W x D x H, mm) |
3,600 x 2,000 x 2,225 |
| Operating System | Linux |
UNI940FL
After all process of memory semiconductors is completed, this burn-in tester detects early stage defects and fails by operating the memory devices in high/low-temperature.
| Test Device | NAND Flash |
|---|---|
| Parallelism | 9,216 |
| Temperature Range | 25℃ ~ 110℃ |
| Test Frequency | 50Mbps |
| Dimension (W x D x H, mm) |
3,400 x 1,800 x 2,300 |
| Operating System | Linux |
